JEOL Releases New Schottky FE Scanning Electron Microscope

 


JEOL Ltd. is pleased to introduce the latest Schottky Field Emission Scanning Electron Microscope, the JSM-IT810, which will be available on July 28, 2024.


Field Emission Scanning Electron Microscopes are essential tools in various scientific and technological fields, including research institutions, universities, and industries. The demand for instruments that offer ease of use, accuracy, speed, and efficiency in observation and analysis is steadily increasing.


The JSM-IT810 comes with the innovative "Neo Action" automatic observation and analysis feature, as well as an automatic calibration function, building upon the capabilities of the JSM-IT800. Equipped with the advanced electron optical control system "Neo Engine" and the user-friendly "SEM Center" with features like Zeromag and EDS integration, this new model not only enhances efficiency and productivity but also addresses challenges related to labor shortages.


Key Features:


1. "Neo Action" Automatic Observation and Analysis Function:

Simply select the SEM image acquisition conditions and field of view, and the function will automatically carry out SEM observation and EDS analysis. This feature significantly improves the efficiency of routine tasks, including analysis work.


2. Automatic Calibration Function "SEM Automatic Adjustment Package":

This function allows for the automatic execution of alignment adjustment, magnification adjustment, and EDS energy calibration.


3. "Live Function":

The Live Function offers Live 3D, Live Analysis, and Live Map capabilities. It enables the construction of 3D images in real-time during SEM observation to obtain information on surface unevenness and depth. Additionally, it ensures the continuous display of characteristic X-ray spectra and elemental mapping.


4. EDS Integration:

The integration of SEM observation and EDS analysis allows for point, area, and MAP analysis directly from the observation screen. The inclusion of Windowless EDS-Gather-X enables high-sensitivity detection and analysis from Li with high spatial resolution.


More Information : https://www.techdogs.com/tech-news/business-wire/jeol-new-schottky-field-emission-scanning-electron-microscope-jsm-it810-released

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